Overview

Sources of Damage

Radiation Hardening

Alternative Techniques

Impact on Mission

Electronics Resilency References

Resiliency of Electronics

The major elements that extraterrestrial spacecraft must be designed to withstand are extreme temperatures, high levels of radiation, and the physical stress caused during launch. Radiation poses the most unique design challenge for these spacecraft compared to typical terrestrial applications. It can cause minor or even fatal errors in integrated circuits. Significant sources of radiation for which space missions must account include:

Galactic cosmic rays represent the most significant threat to the spacecraft. The Space Buster probe must traverse 10.5 light years, which is plenty of time to accumulate errors.

Radiation can causes both transient and permanent errors. If the radiation particle has sufficient energy, the crystal lattice of the semiconductor can become permanently damaged. This is known as lattice displacement. Severe lattice displacement can break transistor by forming recombination centers in pn junctions, depleting minority carriers, and causing parasitic capacitances. Latch up refers to short-circuiting between circuit elements. It can be a significant risk for integrated circuits, due to the close proximity of components. Permanent errors are caused by ionization effects. Charged particles can cause the voltage of a bit register to pass a decision threshold, resulting in a bit in error. While a bit error is typically a transient, soft glitch, it can sometimes trigger a chain reaction of errors resulting in system failure.